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    ITC
    2000
    IEEE
    79views Hardware» more  ITC 2000»
    Analysis of failure sources in surface-micromachined MEMS
    15 years 9 months ago
    Analysis of failure sources in surface-micromachined MEMS
    Download  www.ece.cmu.edu
    Nilmoni Deb, Ronald D. Blanton
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    ITC
    2000
    IEEE
    55views Hardware» more  ITC 2000»
    Low power BIST design by hypergraph partitioning: methodology and architectures
    15 years 9 months ago
    Low power BIST design by hypergraph partitioning: methodology and architectures
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    Patrick Girard, Christian Landrault, Loïs Gui...
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    ITC
    2000
    IEEE
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    Using on-chip test pattern compression for full scan SoC designs
    15 years 9 months ago
    Using on-chip test pattern compression for full scan SoC designs
    Download  www.lirmm.fr
    Helmut Lang, Jens Pfeiffer, Jeff Maguire
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    ITC
    2000
    IEEE
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    A domain coverage metric for the validation of behavioral VHDL descriptions
    15 years 9 months ago
    A domain coverage metric for the validation of behavioral VHDL descriptions
    Download  testlab.ics.uci.edu
    Qiushuang Zhang, Ian G. Harris
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    ITC
    2000
    IEEE
    93views Hardware» more  ITC 2000»
    Analysis of interconnect crosstalk defect coverage of test sets
    15 years 9 months ago
    Analysis of interconnect crosstalk defect coverage of test sets
    Download  esdat.ucsd.edu
    Yi Zhao, Sujit Dey
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