29 search results - page 4 / 6 » itc 1998 |
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...