106 search results - page 20 / 22 » itc 2003 |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
ATS
2003
IEEE
14 years 3 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...