240 search results - page 41 / 48 » vlsi 2005 |
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
Increasingly significant power/ground supply voltage degradation in nanometer VLSI designs leads to system performance degradation and even malfunction. Existing techniques focus...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
A priori wirelength estimation is concerned with predicting various wirelength characteristics before placement. In this work we propose a novel, accurate estimator of net lengths...