Sciweavers

DAC
1999
ACM
14 years 3 months ago
Model Order-Reduction of RC(L) Interconnect Including Variational Analysis
As interconnect feature sizes continue to scale to smaller dimensions, long interconnect can dominate the IC timing performance, but the interconnect parameter variations make it ...
Ying Liu, Lawrence T. Pileggi, Andrzej J. Strojwas
DAC
1999
ACM
14 years 3 months ago
Common-Case Computation: A High-Level Technique for Power and Performance Optimization
This paper presents a design methodology, called common-case computation (CCC), and new design automation algorithms for optimizing power consumption or performance. The proposed ...
Ganesh Lakshminarayana, Anand Raghunathan, Kamal S...
DAC
1999
ACM
14 years 3 months ago
On ILP Formulations for Built-In Self-Testable Data Path Synthesis
In this paper, we present a new method to the built-in selftestable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, ...
Han Bin Kim, Dong Sam Ha, Takeshi Takahashi
DAC
1999
ACM
14 years 3 months ago
Panel: Cell Libraries - Build vs. Buy; Static vs. Dynamic
Kurt Keutzer, Kurt Wolf, David Pietromonaco, Jay M...
DAC
1999
ACM
14 years 3 months ago
Interconnect Analysis: From 3-D Structures to Circuit Models
In this survey paper we describethe combination of: discretized integral formulations, sparsication techniques, and krylov-subspace based model-order reduction that has led to rob...
Mattan Kamon, Nuno Alexandre Marques, Yehia Massou...
DAC
1999
ACM
14 years 3 months ago
Software Environment for a Multiprocessor DSP
Asawaree Kalavade, Joe Othmer, Bryan D. Ackland, K...
DAC
1999
ACM
14 years 3 months ago
Leakage Control with Efficient Use of Transistor Stacks in Single Threshold CMOS
The state dependence of leakage can be exploited to obtain modest leakage savings in CMOS circuits. However, one can modify circuits considering state dependence and achieve large...
Mark C. Johnson, Dinesh Somasekhar, Kaushik Roy
DAC
1999
ACM
14 years 3 months ago
IC Test Using the Energy Consumption Ratio
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
Wanli Jiang, Bapiraju Vinnakota