In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
As VLSI fabrication technology progresses to 65nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits us...
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
With continued scaling of technology into nanometer regimes, the impact of coupling induced delay variations is significant. While several coupling-aware static timers have been pr...
Debasish Das, Kip Killpack, Chandramouli V. Kashya...
In this paper, we present the complete design and architectural details of MAIZEROUTER. MAIZEROUTER reflects a significant leap in progress over existing publicly available routing...
Traditionally, clock network layout is performed after cell placement. Such methodology is facing a serious problem in nanometer IC designs where people tend to use huge clock buff...