Sciweavers

FCCM
2004
IEEE
143views VLSI» more  FCCM 2004»
14 years 3 months ago
Reconfigurable Molecular Dynamics Simulator
Current high-performance applications are typically implemented on large-scale general-purpose distributed or multiprocessing systems often based on commodity microprocessors. Fie...
Navid Azizi, Ian Kuon, Aaron Egier, Ahmad Darabiha...
FCCM
2004
IEEE
163views VLSI» more  FCCM 2004»
14 years 3 months ago
Implementation Results of Bloom Filters for String Matching
Network Intrusion Detection and Prevention Systems (IDPS) use string matching to scan Internet packets for malicious content. Bloom filters offer a mechanism to search for a large...
Michael Attig, Sarang Dharmapurikar, John W. Lockw...
FCCM
2004
IEEE
89views VLSI» more  FCCM 2004»
14 years 3 months ago
Word-Length Optimization of Folded Polynomial Evaluation
ended abstract presents further results from the word-length optimization system Right-Size described at FCCM 2003. The system is used to quantify the compiletime specialization s...
George A. Constantinides, Abunaser Miah, Nalin Sid...
FCCM
2004
IEEE
109views VLSI» more  FCCM 2004»
14 years 3 months ago
Unifying Bit-Width Optimisation for Fixed-Point and Floating-Point Designs
This paper presents a method that offers a uniform treatment for bit-width optimisation of both fixed-point and floating-point designs. Our work utilises automatic differentiation...
Altaf Abdul Gaffar, Oskar Mencer, Wayne Luk, Peter...
DFT
2004
IEEE
101views VLSI» more  DFT 2004»
14 years 3 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
DFT
2004
IEEE
134views VLSI» more  DFT 2004»
14 years 3 months ago
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lomb...
DFT
2004
IEEE
118views VLSI» more  DFT 2004»
14 years 3 months ago
Defect Characterization for Scaling of QCA Devices
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tah...
DFT
2004
IEEE
90views VLSI» more  DFT 2004»
14 years 3 months ago
An XOR Based Reed-Solomon Algorithm for Advanced RAID Systems
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
Ping-Hsun Hsieh, Ing-Yi Chen, Yu-Ting Lin, Sy-Yen ...
DFT
2004
IEEE
114views VLSI» more  DFT 2004»
14 years 3 months ago
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, ...
DFT
2004
IEEE
94views VLSI» more  DFT 2004»
14 years 3 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...