This paper presents theoretical yet practical methodologies to model, assure and optimize the Reliability of Clockless Wave Pipeline. Clockless wave pipeline is a cutting-edge and...
T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lomb...
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
The rapidly expanding diversity of technology available at the nanoscale is disrupting the existing transistorcentric microelectronics design paradigm, resulting in nearly decade-l...
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
Modern embedded devices (e.g., PDAs, mobile phones) are now incorporating Java as a very popular implementation language in their designs. These new embedded systems include multi...