DAC
2004
ACM
14 years 4 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
DAC
2004
ACM
14 years 4 months ago
2004
ACM
In a CMOS combinational logic circuit, the subthreshold leakage current in the standby state depends on the state of the inputs. In this paper we present a new approach to identif...
DAC
2004
ACM
14 years 4 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
DAC
2004
ACM
14 years 4 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Grid-warping is a new placement algorithm based on a strikingly simple idea: rather than move the gates to optimize their location, we elastically deform a model of the 2-0 chip s...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
—This paper proposes a novel approach to the exact symbolic analysis of very large analog circuits. The new method is based on determinant decision diagrams (DDDs) representing s...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
System-on-Chip (SoC) designs are increasingly becoming more complex. Efficient on-chip communication architectures are critical for achieving desired performance in these systems....
DAC
2004
ACM
14 years 5 months ago
2004
ACM
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...