DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated paramete...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
We present the implementation and analysis of a variation tolerant version of a switch-to-switch link in a NoC. The goal is to tolerate the effects of process variations on NoC ar...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
Constant-coefficient multipliers are fundamental components in digital signal processing and arithmetic-based systems. Their verification, however, remains difficult and time-cons...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
Token passing is a channel access technique used in several communication networks. Among them, one of the most effective solution for supporting both real-time traffic (synchron...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
DATE
2008
IEEE
14 years 7 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...