DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
—This paper explores the use of dynamic compilation for continuing execution even if one or more of the memory banks used by an application become temporarily unavailable (but th...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
As the number of cores continues to grow in both digital signal and general purpose processors, tools which perform automatic scheduling from model-based designs are of increasing...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
—Processors that deploy fine-grained reconfigurable fabrics to implement application-specific accelerators ondemand obtained significant attention within the last decade. They tr...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
—Multiprocessor System on Chip (MPSoC) architecture is rapidly gaining momentum for modern embedded devices. The vulnerabilities in software on MPSoCs are often exploited to caus...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will so...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Many embedded control systems comprise several control loops that are closed over a network of computation nodes. In such systems, complex timing behavior and communication lead t...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
An inherent performance gap between custom designs and ASICs is one of the reasons why many designers still start their designs from register transfer level (RTL) description rath...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract—Advances in chip-multiprocessor processing capabilities has led to an increased power consumption and temperature hotspots. Maintaining the on-chip temperature is import...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...