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ECRTS
2010
IEEE
14 years 16 days ago
Reducing Delay Jitter of Real-Time Control Tasks through Adaptive Deadline Adjustments
For many control systems, control performance is strongly dependent on delay variations of the control tasks. Such variations can come from a number of sources including task preem...
Shengyan Hong, Xiaobo Sharon Hu, Michael D. Lemmon
DAC
1995
ACM
14 years 3 months ago
Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits
Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
Farid N. Najm, Michael Y. Zhang
RTAS
2002
IEEE
14 years 4 months ago
Minimizing CAN Response-Time Jitter by Message Manipulation
Delay variations (jitter) in computations and communications cause degradation of performance in control applications. There are many sources of jitter, including variations in ex...
Thomas Nolte, Hans Hansson, Christer Norström
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
14 years 5 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
DATE
2008
IEEE
82views Hardware» more  DATE 2008»
14 years 5 months ago
Variation tolerant NoC design by means of self-calibrating links
We present the implementation and analysis of a variation tolerant version of a switch-to-switch link in a NoC. The goal is to tolerate the effects of process variations on NoC ar...
Simone Medardoni, Marcello Lajolo, Davide Bertozzi
PAM
2010
Springer
14 years 6 months ago
A Measurement Study of the Origins of End-to-End Delay Variations
The end-to-end (e2e) stability of Internet routing has been studied for over a decade, focusing on routes and delays. This paper presents a novel technique for uncovering the origi...
Yaron Schwartz, Yuval Shavitt, Udi Weinsberg
ICCAD
2005
IEEE
106views Hardware» more  ICCAD 2005»
14 years 8 months ago
FPGA device and architecture evaluation considering process variations
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He