Sciweavers

DAC
2007
ACM
15 years 16 days ago
A Self-Tuning Configurable Cache
The memory hierarchy of a system can consume up to 50% of microprocessor system power. Previous work has shown that tuning a configurable cache to a particular application can red...
Ann Gordon-Ross, Frank Vahid
DAC
2007
ACM
15 years 16 days ago
Scalability of 3D-Integrated Arithmetic Units in High-Performance Microprocessors
Three-Dimensional integration provides a simultaneous improvement in wire-related delay and power consumption of microprocessor circuits. Prior work has looked at the performance,...
Kiran Puttaswamy, Gabriel H. Loh
DAC
2007
ACM
15 years 16 days ago
Hardware Support for Secure Processing in Embedded Systems
The inherent limitations of embedded systems make them particularly vulnerable to attacks. We have developed a hardware monitor that operates in parallel to the embedded processor...
Shufu Mao, Tilman Wolf
DAC
2007
ACM
15 years 16 days ago
Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
DAC
2007
ACM
15 years 16 days ago
Multiprocessor Resource Allocation for Throughput-Constrained Synchronous Dataflow Graphs
Abstract. Embedded multimedia systems often run multiple time-constrained applications simultaneously. These systems use multiprocessor systems-on-chip of which it must be guarante...
Sander Stuijk, Twan Basten, Marc Geilen, Henk Corp...
DAC
2007
ACM
15 years 16 days ago
An Embedded Multi-resolution AMBA Trace Analyzer for Microprocessor-based SoC Integration
The bus tracing is used to catch related signals for further investigation and analysis. However, the trace size of cycleaccurate tracing is large and the trace cycle is shallow u...
Chung-Fu Kao, Ing-Jer Huang, Chi-Hung Lin
DAC
2007
ACM
15 years 16 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2007
ACM
15 years 16 days ago
Off-chip Decoupling Capacitor Allocation for Chip Package Co-Design
Off-chip decoupling capacitor (decap) allocation is a demanding task during package and chip codesign. Existing approaches can not handle large numbers of I/O counts and large num...
Hao Yu, Chunta Chu, Lei He
DAC
2007
ACM
15 years 16 days ago
Alembic: An Efficient Algorithm for CNF Preprocessing
Satisfiability (SAT) solvers often benefit from a preprocessing of the formula to be decided. For formulae in conjunctive normal form (CNF), subsumed clauses may be removed or par...
HyoJung Han, Fabio Somenzi