TVLSI
2008
13 years 11 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
DAC
1994
ACM
14 years 3 months ago
1994
ACM
This paper describes a diagnosis technique for locating design errors in circuit implementations which do not match their functional specification. The method efficiently propagat...
VLSID
2000
IEEE
14 years 3 months ago
2000
IEEE
Diagnosis algorithms targeting design errors in RTL circuit descriptions are presented in this paper. The algorithms presented exploit the hierarchy available in RTL designs to lo...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
ICCD
2006
IEEE
14 years 8 months ago
2006
IEEE
— Microprocessors can have design errors that escape the test and validation process. The cost to rectify these errors after shipping the processors can be very expensive as it m...