ICPADS
1998
IEEE
14 years 4 months ago
1998
IEEE
This paper presents a new conceptual model, the XBWModel. Distributed computing is becoming a cost effective way to implement safety critical control systems. To support the devel...
ICCAD
2000
IEEE
14 years 4 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
EVOW
2001
Springer
14 years 4 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
GLVLSI
2002
IEEE
14 years 5 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
DFT
2002
IEEE
14 years 5 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
CLUSTER
2002
IEEE
2002
IEEE
Design and Validation of Portable Communication Infrastructure for Fault-Tolerant Cluster Middleware
14 years 5 months ago
We describe the communication infrastructure (CI) for our fault-tolerant cluster middleware, which is optimized for two classes of communication: for the applications and for the ...
IPPS
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract— The increasing use of electronics in the automotive and avionic domain has lead to dramatic improvements with respect to functionality, safety, and cost. However, with ...
DSN
2005
IEEE
14 years 5 months ago
2005
IEEE
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...
DATE
2006
IEEE
14 years 6 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
MEMOCODE
2007
IEEE
14 years 6 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...