ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
—In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper w...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
Abstract—SAT-based ATPG turned out to be a robust alternative to classical structural ATPG algorithms such as FAN. The number of unclassified faults can be significantly reduce...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
ATS
2009
IEEE
14 years 8 months ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...