ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
—In today’s many-core era, the interconnection networks have been the key factor that dominates the performance of a computer system. In this paper, we propose a design flow t...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
Abstract—Buffer resizing and buffer insertion are two transformation techniques for the performance optimization of elastic systems. Different approaches for each technique have ...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
— VLIW processors provide higher performance and better efficiency etc. than RISC processors in specific domains like multimedia applications etc. A disadvantage is the bloated...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different exposures)...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
— In today’s VLSI designs, there can be many blockages in a routing region. The obstacle-avoiding rectilinear Steiner minimum tree (OARSMT) problem has become an important prob...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
—SystemC is a system-level modeling language that offers a wide range of features to describe concurrent systems rent levels of abstraction. The SystemC standard permits simulato...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
Functional decomposition is a fundamental operation in logic synthesis. Prior BDD-based approaches to functional decomposition suffer from the memory explosion problem and do not...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
ICCAD
2008
IEEE
14 years 9 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...