Abstract— This paper presents an allocation method of decoupling capacitance that explicitly considers timing. We have found and focused that decap does not necessarily improve a...
— In today’s complex SoC designs, verification and debugging are becoming ever more crucial and increasingly timeconsuming tasks. The prevalence of embedded memories adds to t...
Brian Keng, Hratch Mangassarian, Andreas G. Veneri...
— Double patterning technology (DPT) is a most likely lithography solution for 32/22nm technology nodes as of 2008 due to the delay of Extreme Ultra Violet lithography. However, ...
- In this paper, we present a technique to optimize the energy-delay product of a synchronous linear pipeline circuit with dynamic error detection and correction capability running...
In this paper we propose an on-chip bus PMU which makes accurate estimates of system power consumption from a first-order linear power model by utilizing system-level activity in...
Youngjin Cho, Younghyun Kim, Sangyoung Park, Naehy...
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
This paper presents new methods for restructuring logic networks based on fast Boolean techniques. The basis for these are 1) a cut based view of a logic network, 2) exploiting th...
Alan Mishchenko, Robert K. Brayton, Satrajit Chatt...