In this paper we propose a new design methodology targeted for core-based designs using parameterized macrocells (PMC’s). This methodology provides the flexibility for instance...
Makram M. Mansour, Mohammad M. Mansour, Amit Mehro...
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
This paper proposes a new clocking strategy for dynamic circuit. It provides faster performance and smaller area than conventional clocking scheme. The proposed clocking scheme fo...
Mind-boggling complexity of EDA tools necessitates reuse of intellectual property in any large-scale commercial or academic operation. However, due to the nature of software, a to...
Approach Abstracts AltPSM Lithography Requirements for sub-100nm IC Design Domains Pradiptya Ghosh, Chung-shin Kang, Michael Sanie and David Pinto Numerical Technologies, 70 West P...
Pradiptya Ghosh, Chung-shin Kang, Michael Sanie, D...
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
- This paper investigates important problems involved in the design of a CML buffer as well as a chain of tapered CML buffers. A new design procedure to systematically design a cha...