ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A fault fj is said to dominate another fault fi if all tests for fi detect fj . When two faults dominate each other, they are called equivalent. Dominance and equivalence relation...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
We present a measurement module that computes the charge from the transient supply current and provides a digital value of this magnitude. The module is constructed to provide a f...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper presents an electrical and thermal performance analysis of System-in-a-Package (SiP) memory/logic implementation platform based on ChipLaminate-Chip (CLC) technology. I...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
The importance of an interconnect pattern density model in ASIC design flow for a 90nm technology is presented. It is shown that performing the timing analysis at the worst-case c...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper an embedded IDDQ testing architecture is presented that targets to overcome the excessive hardware overhead requirements in built-in current sensing based testing ap...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
The amplitude of coupled noise is often used in estimating the crosstalk effect. Coupling noise-induced delay measures the impact of crosstalk on circuit performance. Efficient c...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
The internal-switching induced simultaneous switching noise (SSN) is studied in the paper. Unlike ground bounce caused by driving off-chip loading, both power-rail and ground-rail...
ISQED
2003
IEEE
14 years 2 months ago
2003
IEEE
As the portion of coupling capacitance increases in smaller process geometries, accurate coupled noise analysis is becoming more important in current design methodologies. We prop...