ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
An open architecture tester allows a third party to develop its own instrument. Such a tester must be open in the sense that it needs to be able to integrate this instrument with ...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
The objective of this paper is to present an infrastructure IP (I-IP) designed to characterize yield loss in the process back-end. The I-IP structure is described in using a botto...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This summary of selected microelectromechanical systems (MEMS) processes guides the reader through a wide variety of fabrication techniques used to make micromechanical structures...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
The IEEE 1149.6 standard was approved in March of 2003. The standard extends the capability of the IEEE 1149.1 standard to include AC-coupled and/or differential nets. These nets ...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...