ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
FPL
2009
Springer
13 years 5 months ago
2009
Springer
In this article, we introduce the ongoing research in modeling and mapping for heterogeneous, customizable, parallel systems, as part of the effort in the newly established Center...
FIC
2009
13 years 5 months ago
2009
ts niveaux d'abstraction. Sch
FIC
2009
13 years 5 months ago
2009
FIC
2009
13 years 5 months ago
2009
EUROCAST
2009
Springer
13 years 5 months ago
2009
Springer
Abstract. Given a basis of a vector space V over a field K and a multiplication table which defines a bilinear map on V , we develop a computer program on Mathematica which checks ...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...