—During the power mode transition, a large surge current may lead to the malfunctions in a power-gating design. In this paper, we introduce several important properties of the s...
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post...
—Register allocation, in high-level synthesis and ASIP design, is the process of determining the number of registers to include in the resulting circuit or processor. The goal is...
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan ...
— We introduce a remote activation scheme that aims to protect integrated circuits (IC) intellectual property (IP) against piracy. Remote activation enables designers to lock eac...
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
—In the VLSI design process, a design implementation often needs to be corrected because of new specifications or design constraint violations. This correction process is referre...