ET
2006
13 years 7 months ago
2006
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
AMCS
2008
13 years 7 months ago
2008
Principal component analysis (PCA) is a powerful fault detection and isolation method. However, the classical PCA which is based on the estimation of the sample mean and covariance...
WM
2003
13 years 9 months ago
2003
: Case-based diagnosis handling multiple faults is still a challenging task. In this paper we present methods for handling multiple faults, embedded in the standard CBR cycle. The ...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleruted once fault sites are located. Previous researches on diagnosis of FPGAs mai...
ITC
2003
IEEE
14 years 26 days ago
2003
IEEE
In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
ATS
2003
IEEE
14 years 27 days ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
ETFA
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, the effect of network-induced delay introduced into the control loop is modelled as time-varying disturbance. Based on this model, a fault isolation filter (FIF) f...
DSD
2007
IEEE
14 years 1 months ago
2007
IEEE
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
In this paper we present an approach to the synthesis of fault-tolerant schedules for embedded applications with soft and hard real-time constraints. We are interested to guarante...
IOLTS
2009
IEEE
14 years 2 months ago
2009
IEEE
—Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considere...