ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
Abstract-- Due to photo-lithography effects and manufacture process variations, the actual features fabricated on the wafer are different from the designed ones. This difference ca...
DFT
1998
IEEE
14 years 4 months ago
1998
IEEE
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
ISQED
2002
IEEE
14 years 5 months ago
2002
IEEE
This paper presents a methodology for the statistical analysis of clock tree structures. It allows to accurately predict and analyze the impact of process variation on clock skew....
DATE
2010
IEEE
14 years 5 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
ATS
2003
IEEE
14 years 5 months ago
2003
IEEE
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
ISLPED
2006
ACM
14 years 6 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
ASPDAC
2006
ACM
14 years 6 months ago
2006
ACM
— Process variations and temperature variations can cause both the frequency and the leakage of the chip to vary significantly from their expected values, thereby decreasing the...
GLVLSI
2006
IEEE
14 years 6 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
GLVLSI
2006
IEEE
14 years 6 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...