ICRA
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract— We introduce a method for fast and accurate registration of multiple horizontal laser scans obtained by a mobile robot. The method is based on novel representation of t...
TCAD
1998
14 years 6 days ago
1998
Conventional scan design imposes considerable area and delay overhead by using larger scan
ip-
ops and additional scan wires without utilizing the functionality of the combinatio...
TCAD
1998
14 years 6 days ago
1998
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
TKDE
2008
14 years 14 days ago
2008
Often, it is required to identify anomalous windows over a spatial region that reflect unusual rate of occurrence of a specific event of interest. A spatial scan statistic-based ap...
PE
2006
Springer
14 years 14 days ago
2006
Springer
In recent years, fast spreading worms, such as Code Red, Slammer, Blaster and Sasser, have become one of the major threats to the security of the Internet. In order to defend agai...
JSAC
2006
14 years 15 days ago
2006
Protecting the network layer from malicious attacks is an important yet challenging security issue in mobile ad hoc networks. In this paper we describe SCAN, a unified networklayer...
CGF
2008
14 years 20 days ago
2008
We present a registration algorithm for pairs of deforming and partial range scans that addresses the challenges of non-rigid registration within a single non-linear optimization....
BMCBI
2010
14 years 20 days ago
2010
Background: Maximizing the utility of DNA microarray data requires optimization of data acquisition through selection of an appropriate scanner setting. To increase the amount of ...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
ATS
2004
IEEE
14 years 4 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...