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ASPDAC
2007
ACM
107views Hardware» more  ASPDAC 2007»
14 years 2 months ago
A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
Seongmoon Wang, Wenlong Wei
ITC
2003
IEEE
138views Hardware» more  ITC 2003»
14 years 4 months ago
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint
Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized...
Yannick Bonhomme, Patrick Girard, Loïs Guille...
DATE
2005
IEEE
112views Hardware» more  DATE 2005»
14 years 4 months ago
Simultaneous Reduction of Dynamic and Static Power in Scan Structures
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
Shervin Sharifi, Javid Jaffari, Mohammad Hosseinab...
IROS
2006
IEEE
164views Robotics» more  IROS 2006»
14 years 4 months ago
SLAM using Visual Scan-Matching with Distinguishable 3D Points
— Scan-matching based on data from a laser scanner is frequently used for mapping and localization. This paper presents an scan-matching approach based instead on visual informat...
Federico Bertolli, Patric Jensfelt, Henrik I. Chri...
INFOCOM
2007
IEEE
14 years 5 months ago
Service Charge and Energy-Aware Vertical Handoff in Integrated IEEE 802.16e/802.11 Networks
Abstract— This paper considers two issues arising in an integrated IEEE 802.16e/802.11 network: 1) finding a possible network, which mobile station (MSTA) can switch to, and 2) ...
Youngkyu Choi, Sunghyun Choi
DATE
2007
IEEE
172views Hardware» more  DATE 2007»
14 years 5 months ago
Diagnosis, modeling and tolerance of scan chain hold-time violations
Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of ma...
Ozgur Sinanoglu, Philip Schremmer
DFT
2008
IEEE
86views VLSI» more  DFT 2008»
14 years 5 months ago
Enhancing Silicon Debug via Periodic Monitoring
Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is ti...
Joon-Sung Yang, Nur A. Touba
DATE
2008
IEEE
139views Hardware» more  DATE 2008»
14 years 5 months ago
Scan Chain Organization for Embedded Diagnosis
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
Melanie Elm, Hans-Joachim Wunderlich