DAC
2004
ACM
14 years 4 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
ITC
2003
IEEE
14 years 6 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...
DFT
2003
IEEE
14 years 6 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
DATE
2006
IEEE
14 years 6 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...