522 search results - page 51 / 105 » A Note on Designing Logical Circuits Using SAT |
ISCA
2000
IEEE
13 years 11 months ago
2000
IEEE
Our program benchmarks and simulations of novel circuits indicate that large-window processors are feasible. Using our redesigned superscalar components, a large-window processor ...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
A dynamic noise model is developed and applied to analyze the noise immunity of precharge-evaluate circuits. Considering that the primary source of noise-injection in the circuit ...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
FPL
2005
Springer
14 years 28 days ago
2005
Springer
In many industrial processes, an incorrect operation can lead to irreparable damage to people, equipment, or the environment. In order to reduce risks, the electronic control syst...