95 search results - page 3 / 19 » A Novel Functional Test Generation Method for Processors Usi... |
ASPDAC
2005
ACM
13 years 10 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
TC
1998
13 years 7 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
ICCAD
1999
IEEE
14 years 6 days ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
ISQED
2002
IEEE
14 years 25 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...