29 search results - page 1 / 6 » A Real Case of Significant Scan Test Cost Reduction |
ISVLSI
2008
IEEE
14 years 5 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
SAC
2009
ACM
14 years 6 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
ICSM
2005
IEEE
14 years 4 months ago
2005
IEEE
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
DATE
2005
IEEE
14 years 4 months ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...