209 search results - page 19 / 42 » A Systematic Approach for Designing Testable VLSI Circuits |
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
ARITH
2009
IEEE
14 years 2 months ago
2009
IEEE
Moduli of the form 2n ± 1, which greatly simplify certain arithmetic operations in residue number systems (RNS), have been of longstanding interest. A steady stream of designs fo...
GLVLSI
2010
IEEE
14 years 25 days ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
DATE
2010
IEEE
14 years 25 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...