102 search results - page 3 / 21 » A design platform for 90-nm leakage reduction techniques |
DAC
2003
ACM
14 years 8 months ago
2003
ACM
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated paramete...
TVLSI
2010
13 years 2 months ago
2010
Digital calibration techniques are widely utilized to linearize pipelined analog-to-digital converters (ADCs). However, their power dissipation can be prohibitively high, particula...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
As a result of aggressive technology scaling, gate leakage (gate oxide direct tunneling) has become a major component of total power dissipation. Use of dielectrics of higher perm...