179 search results - page 17 / 36 » A new test pattern generation method for delay fault testing |
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
ICCAD
1999
IEEE
14 years 1 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
DSD
2006
IEEE
14 years 2 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...