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ICCD
2005
IEEE
221views Hardware» more  ICCD 2005»
14 years 4 months ago
Broadband Impedance Matching for Inductive Interconnect in VLSI Packages
Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
Brock J. LaMeres, Sunil P. Khatri
DAC
2009
ACM
14 years 9 months ago
Handling complexities in modern large-scale mixed-size placement
In this paper, we propose an effective algorithm flow to handle largescale mixed-size placement. The basic idea is to use floorplanning to guide the placement of objects at the gl...
Jackey Z. Yan, Natarajan Viswanathan, Chris Chu
GLVLSI
2005
IEEE
118views VLSI» more  GLVLSI 2005»
14 years 1 months ago
High-diagnosability online built-in self-test of FPGAs via iterative bootstrapping
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
Vishal Suthar, Shantanu Dutt
DFT
2003
IEEE
79views VLSI» more  DFT 2003»
14 years 1 months ago
Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
Kartik Mohanram, Nur A. Touba
GLVLSI
2006
IEEE
90views VLSI» more  GLVLSI 2006»
14 years 2 months ago
Low-power clustering with minimum logic replication for coarse-grained, antifuse based FPGAs
This paper presents a minimum area, low-power driven clustering algorithm for coarse-grained, antifuse-based FPGAs under delay constraints. The algorithm accurately predicts logic...
Chang Woo Kang, Massoud Pedram