In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
In this paper, we study the simultaneous transistor and interconnect sizing (STIS) problem. We dene a class of optimization problems as CH-posynomial programs and reveal a genera...
Multi-instance multi-label learning (MIML) is a framework for supervised classification where the objects to be classified are bags of instances associated with multiple labels....
Recently, a large amount of work has been done in XML data mining. However, we observed that most of the existing works focus on the snapshot XML data, while XML data is dynamic i...
Qiankun Zhao, Sourav S. Bhowmick, Mukesh K. Mohani...
Highly regular, nanodevice based architectures have been proposed to replace pure CMOS based architectures in the emerging post CMOS era. Since bottom-up self-assembly is used to ...