2451 search results - page 23 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ISSRE
2003
IEEE
14 years 28 days ago
2003
IEEE
Systematic design testing, in which executable models of behaviors are tested using inputs that exercise scenarios, can help reveal flaws in designs before they are implemented i...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
ICALT
2010
IEEE
13 years 8 months ago
2010
IEEE
In this study I use statistical Natural Language Processing and adapted Controlled Language methods to preprocess individual documents before they are used as source documents for ...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...