2451 search results - page 53 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ICDM
2008
IEEE
14 years 2 months ago
2008
IEEE
Association analysis arises in many important applications such as bioinformatics and business intelligence. Given a large collection of measurements over a set of samples, associ...
ITC
2000
IEEE
14 years 3 days ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
TSMC
1998
13 years 7 months ago
1998
Abstract—We present a general scheme for learning sensorimotor tasks which allows rapid on-line learning and generalization of the learned knowledge to unfamiliar objects. The sc...
ITC
1992
IEEE
13 years 11 months ago
1992
IEEE
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...