48 search results - page 5 / 10 » An Embedded IDDQ Testing Architecture and Technique |
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
DAC
2002
ACM
14 years 7 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
DAC
1999
ACM
13 years 11 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
LCTRTS
2009
Springer
14 years 1 months ago
2009
Springer
Dynamic binary translation (DBT) can provide security, virtualization, resource management and other desirable services to embedded systems. Although DBT has many benefits, its r...
DAC
2011
ACM
12 years 6 months ago
2011
ACM
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...