1727 search results - page 128 / 346 » An Integrated Approach to Manufacturing Process Design and C... |
146
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DSN
2004
IEEE
15 years 8 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
127
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ISCAS
2005
IEEE
15 years 10 months ago
2005
IEEE
Abstract—Low-power, single-chip integrated systems are prevailing in remote applications due to the increasing power and delay cost of inter-chip communication compared to on-chi...
132
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ICCD
2006
IEEE
16 years 1 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
122
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ISPD
2003
ACM
15 years 10 months ago
2003
ACM
Previous works on buffer planning are mainly based on fixed die placement. It is necessary to reduce the complexity of computing the feasible buffer insertion sites to integrate t...
142
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ICPR
2004
IEEE
16 years 5 months ago
2004
IEEE
Parallel processors such as SIMD computers have been successfully used in various areas of high performance image and data processing. Due to their characteristics of highly regula...