— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
Matthew R. Guthaus, Natesan Venkateswaran, Chandu ...
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
Shrinking feature sizes and process variations are of increasing concern in modern technology. It is urgent that we develop statistical interconnect timing models which are harmon...
We propose a scalable and efficient parameterized block-based statistical static timing analysis algorithm incorporating both Gaussian and non-Gaussian parameter distributions, ca...
This paper focuses on statistical interconnect timing analysis in a parameterized block-based statistical static timing analysis tool. In particular, a new framework for performin...