1398 search results - page 162 / 280 » Application-Specific Integrated Circuits |
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
A high-to-low switching DC-DC converter that operates at input supply voltages up to two times as high as the maximum voltage permitted in a nanometer CMOS technology is proposed ...
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
This work first presents an analytical repeater insertion method which optimizes power under delay constraint for a single net. This method finds the optimal repeater insertion ...
FPGA
2005
ACM
14 years 1 months ago
2005
ACM
Logic duplication is an effective method for improving circuit performance. In this paper we present an algorithm named SPD that performs simultaneous placement and duplication to...