1398 search results - page 28 / 280 » Application-Specific Integrated Circuits |
DAC
2004
ACM
14 years 11 months ago
2004
ACM
VLSID
2005
IEEE
14 years 10 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
ICCAD
2001
IEEE
14 years 7 months ago
2001
IEEE
3DIC
2009
IEEE
14 years 4 months ago
2009
IEEE
NANONET
2009
Springer
14 years 4 months ago
2009
Springer
A new approach for inserting repeaters in 3-D interconnects is proposed. The allocation of repeaters along an interplane interconnect is iteratively determined. The proposed approa...