In this paper, we propose a new technique for the combined voltage scaling of processors and communication links, taking into account dynamic as well as leakage power consumption....
Alexandru Andrei, Marcus T. Schmitz, Petru Eles, Z...
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
The piecewise-linear approximation technique developed by Juli´an et al. in the past few years is applied to dynamical systems dependent on given numbers of state variables and p...