57 search results - page 5 / 12 » Architecture-Driven Reliability and Energy Optimization for ... |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
CODES
2006
IEEE
14 years 1 months ago
2006
IEEE
It is observed that pulsed discharge currents allow to drain the battery with a higher specific power. Thus they improve the batteries durability and discharge performance. The q...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
As application complexity increases, modern embedded systems have adopted heterogeneous processing elements to enhance the computing capability or to reduce the power consumption. ...
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
As the "system-on-a-chip" concept is rapidly becoming a reality, time-to-market and product complexity push the reuse of complex macromodules. Circuits combining a varie...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
As the hardware and software complexity grows, it is unlikely for the power management hardware/software to have a full observation of the entire system status. In this paper, we ...