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DATE
2007
IEEE
97views Hardware» more  DATE 2007»
15 years 10 months ago
Estimating functional coverage in bounded model checking
Formal verification is an important issue in circuit and system design. In this context, Bounded Model Checking (BMC) is one of the most successful techniques. But even if all sp...
Daniel Große, Ulrich Kühne, Rolf Drechs...
FPL
2007
Springer
133views Hardware» more  FPL 2007»
15 years 10 months ago
Efficient Modeling and Floorplanning of Embedded-FPGA Fabric
In this paper we present an automatic design flow for generating customized embedded FPGA (eFPGA) fabric and a domain specific SOC+eFPGA architecture. This design flow encompas...
Sumanta Chaudhuri, Jean-Luc Danger, Sylvain Guille...
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
15 years 10 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
ICCAD
2003
IEEE
193views Hardware» more  ICCAD 2003»
15 years 9 months ago
FROSTY: A Fast Hierarchy Extractor for Industrial CMOS Circuits
: This paper presents FROSTY, a computer program for automatically extracting the hierarchy of a large-scale digital CMOS circuit from its transistor-level netlist description and ...
Lei Yang, C.-J. Richard Shi
DATE
2006
IEEE
142views Hardware» more  DATE 2006»
15 years 10 months ago
Droplet routing in the synthesis of digital microfluidic biochips
same level of system-level CAD support that is now commonplace in the IC industry.Recent advances in microfluidics are expected to lead to sensor systems for high-throughput bioche...
Fei Su, William L. Hwang, Krishnendu Chakrabarty