1151 search results - page 7 / 231 » Automatic Generation of Complex Properties for Hardware Desi... |
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
VLSID
2003
IEEE
14 years 8 months ago
2003
IEEE
Design of efficient System-on-Chips (SoCs) require thorough application analysis to identify various compute intensive parts. These compute intensive parts can be mapped to hardwa...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
FDL
2005
IEEE
14 years 1 months ago
2005
IEEE
Although Moore’s Law enables a huge number of components to be integrated into a single chip, design methods that will allow system architects to put the components together to ...