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» Balance Testing of Logic Circuits
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DATE
2003
IEEE
145views Hardware» more  DATE 2003»
14 years 27 days ago
Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...
Michael Nicolaidis, Nadir Achouri, Slimane Boutobz...
ICCAD
2001
IEEE
108views Hardware» more  ICCAD 2001»
14 years 4 months ago
Single-Pass Redundancy Addition and Removal
Redundancy-addition-and-removal is a rewiring technique which for a given target wire wt finds a redundant alternative wire wa. Addition of wa makes wt redundant and hence removab...
Chih-Wei Jim Chang, Malgorzata Marek-Sadowska
ISMVL
2007
IEEE
92views Hardware» more  ISMVL 2007»
14 years 1 months ago
Experimental Studies on SAT-Based ATPG for Gate Delay Faults
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
Stephan Eggersglüß, Daniel Tille, G&oum...
ITC
2003
IEEE
125views Hardware» more  ITC 2003»
14 years 26 days ago
Progressive Bridge Identification
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Bla...
DATE
2008
IEEE
76views Hardware» more  DATE 2008»
14 years 2 months ago
Signal Probability Based Statistical Timing Analysis
VLSI timing analysis and power estimation target the same circuit switching activity. Power estimation techniques are categorized as (1) static, (2) statistical, and (3) simulatio...
Bao Liu