5 search results - page 1 / 1 » Bridging fault testability of BDD circuits |
ASPDAC
2005
ACM
14 years 26 days ago
2005
ACM
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
ATS
2003
IEEE
14 years 4 months ago
2003
IEEE
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
VTS
2003
IEEE
14 years 4 months ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Circuit fabrics composed of highly regular structures, called logic bricks, have been described recently for improving yield. An automated logic brick design flow based on a SAT ...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
In this work, the problem of open faults affecting the interconnections of SC circuits composed by data-path and control is analyzed. In particular, it is shown that, in case open...