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ITC
1998
IEEE
77views Hardware» more  ITC 1998»
14 years 5 days ago
Deterministic BIST with multiple scan chains
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
Gundolf Kiefer, Hans-Joachim Wunderlich
BIOINFORMATICS
2005
89views more  BIOINFORMATICS 2005»
13 years 7 months ago
Doelan: a solution for quality control monitoring of microarray production
: Doelan is an automated tool to check the quality of produced DNA microarrays. This software is based on the execution of test suites on quality control data to validate batches o...
Laurent Jourdren, Stéphane Le Crom
TVLSI
2002
107views more  TVLSI 2002»
13 years 7 months ago
Low-power clock distribution using multiple voltages and reduced swings
: Clock networks account for a significant fraction of the power dissipation of a chip and are critical to performance. This paper presents theory and algorithms for building a low...
Jatuchai Pangjun, Sachin S. Sapatnekar
ISPD
2010
ACM
163views Hardware» more  ISPD 2010»
14 years 2 months ago
A statistical framework for designing on-chip thermal sensing infrastructure in nano-scale systems
Thermal/power issues have become increasingly important with more and more transistors being put on a single chip. Many dynamic thermal/power management techniques have been propo...
Yufu Zhang, Bing Shi, Ankur Srivastava
DATE
2008
IEEE
104views Hardware» more  DATE 2008»
14 years 2 months ago
Multi-Vector Tests: A Path to Perfect Error-Rate Testing
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
Shideh Shahidi, Sandeep Gupta